【 Chengfeng Technology invites you to join in the grand event 】 Unveiling 5in1 technology, opening a
Release time: 2024-05-24

On May 23rd, Chengfeng Technology delivered a wonderful speech on 5in1 front-end optical testing equipment at the 26th Integrated Circuit Manufacturing Annual Conference and Supply Chain Innovation and Development Conference in Guangzhou.

Chengfeng Technology has always been committed to the research and innovation of semiconductor testing technology. At this conference, Chengfeng focused on introducing the application of 5in1 front-end optical detection equipment in the YE department, as well as breaking through overseas technology blockades and mastering four sets of key optical imaging technologies:

1. Light and dark field composite optical path technology

2. Transparent wafer imaging technology

3. Photoluminescence imaging technology

4. Infrared penetration imaging technology

The breakthrough in this technology is crucial for the YE department in semiconductor manufacturing plants (FAB factories), where Chengfeng testing equipment helps reduce costs, improve product yield and reliabilityThe role of.

 

Chengfeng Technology was established in 2015, focusing on and deeply cultivating the research and development, production, and sales of optical visual inspection equipment in the semiconductor industry. The company provides comprehensive semiconductor manufacturing yield control and visual defect detection solutions. Developed multiple series of graphic wafer detection equipment with fully independent intellectual property rights, including production line defect monitoring: CFW820 series FAB front-end process control equipment - CFW920 series, back-end process AOI detection equipment - CFW380 series, and infrared detection equipment CFW680 series. According to market demand and technological development trends. This year, Mask peripheral graphics detection equipment and CFW520 non graphics wafer detection equipment have been launched successively.

Stay tuned for the second sharing, let's witness the innovation and development of semiconductor optical testing technology together