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CFW510 is a high-performance, high-resolution infrared penetration measurement microscope that supports silicon-based wafers and 6-inch/8-inch/12 inch wafers. It is equipped with an industrial computer/image display and measurement software, and features an integrated design.
CFW510 | |
Specific parameters/specifications | √ Wavelength: 1050-1700nm |
√ Penetration range: 0~800um | |
√ Objective magnification: 5X/10X/20X | |
√ Objective lens: 2.5X/5X/10X | |