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Optical quantity detection equipment for wafer manufacturing series
Mask template manufacturing optical quantity detection equipment series
Optical quantity detection equipment for wafer packaging testing series
Passive components and lead frame AOI series
FAB front-end defect monitoring equipment CFW820
FAB front-end process control equipment CFW920
Front graphic defect detection equipment CFW821
Front nano pattern defect detection equipment CFW921
Wafer geometry measurement equipment CFW830
Semi automatic infrared penetration measurement microscope CFW510
Fully automatic infrared penetration engraving measuring equipment CFW520
Wafer mask detection equipment CFY210
UV Reticle defect detection equipment CFY401
DUV Reticle defect detection equipment CFY501
Grain six sided inspection equipment (Wafer to wafer) CF910-C
High speed grain flipping equipment CF971
High end lead frame line scanning AOI equipment CF-320C
Lead frame stamping online AOI equipment CF-150
Lead frame electroplating online AOI equipment CF160
Capacitive Hexahedral AOI Equipment CF-610
SERVICE&SUPPORT
Sealing and testing factory Our solution provides quality control for packaging and testing factories.
Wafer manufacturer Our solution uses artificial intelligence to accelerate testing and provide power for wafer fabs.
Passive component manufacturer Due to rapid expansion, the demand for testing from passive component manufacturers has also increased accordingly! Our solution has improved the quality.
Lead frame factory Our solution ensures the high quality and reliability standards of the lead frame factory.
OEM&ODM
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Interested in or having questions about this product?
CFY501 is a DUV ultra-high resolution Reticle detection device currently under development and will be launched in 2025. Stay tuned.
