Mingchang Nanographic Wafer Defect Detection Equipment (920 Series)
Mingchang Nanographic Wafer Defect Detection Equipment (921 Series)
Semi automatic infrared penetration measurement microscope CFW510
Fully automatic infrared penetration engraving measuring equipment CFW520
Having been deeply involved in the semiconductor field for several years, we are committed to the pursuit of excellence in appearance defect detection technology. We specialize in providing personalized, high-precision semiconductor detection equipment customization services to meet your unique needs and high standard requirements.