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Optical quantity detection equipment for wafer manufacturing series
Mask template manufacturing optical quantity detection equipment series
AOI series equipment for optical module production line
Graphic wafer defect detection equipment (820 series)
Graphic wafer defect detection equipment (821 series)
Mingchang Nanographic Wafer Defect Detection Equipment (920 Series)
Mingchang Nanographic Wafer Defect Detection Equipment (921 Series)
Wafer geometry measurement equipment CFW830
Semi automatic infrared penetration measurement microscope CFW510
Fully automatic infrared penetration engraving measuring equipment CFW520
Wafer mask detection equipment CFY210
UV Reticle defect detection equipment CFY401
DUV Reticle defect detection equipment CFY501
Grain six sided inspection equipment (Wafer to wafer) CF910-C
CF910-D Wafer Double-Side Inspection Equipment
CF910-S COS high-resolution detection equipment
Optical module gold wire AOI equipment - CF915
DA chip full detection AOI equipment - CF916
Optical module PCBA AOI equipment - CF917
Optical module finished AOI equipment - CF918
Optical module COB substrate AOI equipment - CF912
Optical module COC chip full detection AOI equipment - CF913
SERVICE&SUPPORT
Wafer manufacturer Application scenarios■ CMP/OQC/ADI/AEI/CMP process control
Mask template manufacturing factory Application Scenarios■ MBB Zone Particle/Particle Detection■ Graphic Detection (D2DB)■ ADI/AII Particle/Particle Detection■ Blank testing (substrate/chrome plating/adhesive coating)■ Maskshot/FAB Reticle graphic defect detection
Optical module manufacturing factory Application Scenarios■ Manufacturing of 800G/1.6T optical modules
Sealing and testing factory Application Scenarios■ Silicon capacitors/chip grains
OEM&ODM
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Zheng Mingguo, founder and chairman of Zhuhai Chengfeng Electronic Technology Co., Ltd., explained that the technological innovation of testing equipment empowers the development of domestic industrial chips.